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Joint Test Action Group
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161	VTOS DDR™ Everything you need to configure, verify and tune DDR During printed circuit board test, a valuable first step is to prove that all DDR memory is functioning properly. Properly operating DDR memory is a Add to Reading List Source URL: www.etoolsmiths.com Language: English - Date: 2015-01-25 12:00:04 DDR SDRAM Digital media Joint Test Action Group DDR3 SDRAM Mobile DDR Dance Dance Revolution Booting SDRAM Electronics Computing
162	onTAP Interconnect Test Product Description Interconnect Test Interconnect tests are a key function of any boundary scan test program. The onTAPInterconnect Test performs the 3 essential functions of boundary scan: 1. C Add to Reading List Source URL: www.flynn.com Language: English - Date: 2015-03-10 14:16:18 Electronic engineering Boundary scan Joint Test Action Group Serial Vector Format Resistor Automatic test pattern generation Boundary scan description language Electronics manufacturing Manufacturing Electronics
163	VTOS Scan™ Everything you need to identify faulty interconnects on your printed circuit board VTOS Scan provides a robust solution for interrogating and finding faults with printed circuit boards that will not boot. VT Add to Reading List Source URL: www.etoolsmiths.com Language: English - Date: 2015-01-25 11:59:59 Electromagnetism Embedded systems IEEE standards Joint Test Action Group Printed circuit board Booting Electronics manufacturing Electronics Manufacturing
164	Collect Trace Information on MCUs without Trace Port iSYSTEM’s Slow Run gathers Debug Trace Information although the MCU has no Trace Port iSYSTEM supports with its development and debugger software winIDEA (since vers Add to Reading List Source URL: www.isystem.com Language: English - Date: 2012-05-04 08:55:30 IEEE standards Debugging Embedded systems Microcontrollers Microprocessors Nexus Joint Test Action Group Profiling Debugger Computer programming Computing Electronics
165	onTAP Testing Undetected Mid-State Shorts JTAG Testing for Undetected Mid-State Shorts How onTAP Detects and Diagnoses Mid-State Shorts Mid-state shorts are bridging faults that result in a mid-state voltage level rathe Add to Reading List Source URL: www.flynn.com Language: English - Date: 2015-03-10 14:16:11 Technology Boundary scan Joint Test Action Group Resistor High impedance Electronics manufacturing Manufacturing Electronics
166	How to overcome/avoid High Frequency Effects on Debug Interfaces – Trace Port Design Guidelines An On-Chip Debugger/Analyzer (OCD) like iSYSTEM’s iC5000 (Figure 1) acts as a link to the target hardware by standard de Add to Reading List Source URL: www.isystem.com Language: English - Date: 2012-04-30 12:22:02 Electronics manufacturing IEEE standards Electronic test equipment Electronic design automation Signal integrity Oscilloscope Joint Test Action Group Printed circuit board Nexus Electronics Electronic engineering Technology
167	www.xjtag.com XJInvestigator Overview Add to Reading List Source URL: www.xjtag.com Language: English - Date: 2014-04-02 07:22:03 Embedded systems IEEE standards Electronic engineering Joint Test Action Group Microcontrollers Boundary scan Debugger Field-programmable gate array Atmel AVR Electronics manufacturing Manufacturing Electronics
168	_ V2.2 Hardware Reference Add to Reading List Source URL: www.isystem.com Language: English - Date: 2014-10-21 08:03:11 Electronic engineering Manufacturing Joint Test Action Group Microcontroller Embedded systems Electronics Electronics manufacturing
169	Trends in medical software development and test V10.01 Add to Reading List Source URL: www.isystem.com Language: English - Date: 2012-04-30 12:22:10 Electronics Software development DO-178B Joint Test Action Group Test automation In-circuit emulator Test execution engine Hardware-in-the-loop simulation Debugging Software testing Embedded systems Computing
170	onTAP® Series 4000 with ProScan B o u n d a r y S c a n Add to Reading List Source URL: www.flynn.com Language: English - Date: 2014-04-03 14:38:02 Manufacturing Joint Test Action Group OnTap Application-specific integrated circuit Electronic engineering Electronics Electronics manufacturing

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